Securing and Optimizing Data Flow by Validating Die Level Interconnect Stress with AES XTS 256-bit Encryption and Ring Interconnect Analysis on edge client SoCs

Author(s):
Gowri Shankar Somanjeri Pankaj Sharma, Ashutosh Mishra, Naveen Urs T R, Aravind Krishnan, Srishti Singh Chauhan
Location:
India
Year:
2025
Type:
Paper
Format:
pdf