Power Probe: Addressing Power Noise Signal Integrity Challenges for Wide IO HBM Memories Through Advanced Verification Approach

Author(s):
Akshobhya B, Bhargava Krishna Venigalla, Giridhar Rangarajan, Gowdra Bomanna Chethan, Anil Deshpande
Location:
India
Year:
2024
Type:
Paper
Format:
pdf