Leveraging Several Functional Safety Methodologies (Full Faults and SRF) to Enhance Design Quality in Automotive IC

Author(s):
Gulshan Kumar Sharma, Sougata Bhattacharjee, Wonil Cho, Akshaya Kumar Jain, James Kim, Sangkyu Park, Hyeonuk Noh, Andrey Likhopoy, Ann Keffer, Arun Gogineni
Location:
United States
Year:
2024
Type:
Paper
Format:
pdf