A Methodology for Evaluating SI Artefacts in DDR4-3DS PHY using Channel Modelling

Author(s):
Aditya S Kumar, Gowdra Bomanna Chethan, Shivani Maurya, Anil Deshpande, Somasunder Kattepura Sreenath
Location:
Europe
Year:
2021
Type:
Paper
Format:
pdf